Solid State Devices Laboratory

Designed to complement the lectures presented in EE 44100 through device testing and measurement. Observations of semiconductor materials properties through experiments involving the Hall effect, photo generation/recombination, and anisotropic etching. Semiconductor PN junctions, uni- and bipolar device characterization through C-V plotting, DC and AC measurements of devices in packages and on wafers and subsequent development of device model parameters. Optional special project opportunity. Laboratory notebook required.